Graduation Semester and Year
2008
Language
English
Document Type
Thesis
Degree Name
Master of Science in Electrical Engineering
Department
Electrical Engineering
First Advisor
Daniel Engels
Abstract
In this thesis, we have identified the effect on the performance of the RFID system when ISO 18000-6 Class 1 Gen 2 RFID protocol's parameters are changed. The protocol parameters we considered changing for the conformance testing are Tari, operating frequency, pulse width and modulation index at the constant transmitted power. The range of frequencies used in the experiments does fall outside the specification of ISO 18000-6 Type-C Class-1 Gen-2 protocol; but the power transmited by the RFID reader is under the FCC regulations. The research gives the detail behavior of the RFID signal propagation both from the reader to the tag and vice versa; and is useful for reader manufacturing and design, where the user has a metric, for what physical parameter to select in the Class1 Gen2 protocol The part of the research was to built a high performance software define RFID reader. The RFID reader is being implemented on the National Instruments PXI-RF and FPGA hardware platform and uses NI LabVIEW 8.5 as the software platform. The reader uses the state-machine based software architecture and also uses RFID FPGA toolkit.The experiments were designed to eliminate the effects of tag's antenna design. The experiments were carried on four different types of tags, and a general theory is proposed in order to study the deviation of the theoretical data and experimental results. All the experiments are conducted in the anechoic chamber and later two experiments were also carried out in the lab conditions. Study also shows the effect of Tari and frequency on the power received from the tag and time between the tag's response after the reader finishes its command.
Disciplines
Electrical and Computer Engineering | Engineering
License
This work is licensed under a Creative Commons Attribution-NonCommercial-Share Alike 4.0 International License.
Recommended Citation
Ayer, Nikhil, "Evaluation Of ISO 18000-6 Type C Class 1 Generation 2 RFID Protocol Artifacts" (2008). Electrical Engineering Theses. 247.
https://mavmatrix.uta.edu/electricaleng_theses/247
Comments
Degree granted by The University of Texas at Arlington