Graduation Semester and Year

2006

Language

English

Document Type

Thesis

Degree Name

Master of Science in Electrical Engineering

Department

Electrical Engineering

First Advisor

Tjuatja Saibun

Abstract

A method using Multi-Resolution technique for window effect mitigation in ISAR imagery, which occurs due to finite extent data, is presented in this work. Proposed method is supported with quantitative measure using both Structural Similarity (SSIM) and Mean Square Error (MSE). In addition, above index measures were used to determine the best choice of wavelet basis for window effect mitigation. Complete angular window and partial angular window are used as two cases to demonstrate the validation of above contributions. Scattering measurements of different test sets were done to validate the approach. Results which include reconstructed images and quantitative index measures are provided to support the approach.

Disciplines

Electrical and Computer Engineering | Engineering

Comments

Degree granted by The University of Texas at Arlington

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