Danny D. Dyer

Document Type


Source Publication Title

Technical Report 31


A problem of considerable interest and for which a great deal of research has been expended is that of determining lower confidence bounds on series system reliability based on subsystem failure data. With regard to the types of failure data taken on the subsystems, primary consideration is given to binomial (pass-fail) data, exponentially distributed time-to-fail data for both Type I censoring (fixed test times) and Type II censoring (fixed number of failures), or any mixture thereof. In this survey we shall examine optimum solutions whenever they exist, approximate optimum solutions, and nonoptimum solutions. Numerical examples are given to illustrate the theory.


Mathematics | Physical Sciences and Mathematics

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Mathematics Commons



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